ON THE IDENTIFICATION TECHNIQUE IN SYSTEM ANALYSIS OF THIN ISLAND FILMS

Authors

  • V. I. Psarev Ukraine, Ukraine
  • L. A. Parkhomenko Zaporizhzhya National Technical University, Ukraine
  • Y. V. Pyankova Zaporizhzhya National Technical University, Ukraine

DOI:

https://doi.org/10.15588/1607-3274-2007-2-5

Abstract

Analytical formulas for a systemic analysis of the structural coarsening of an island films on a solid substrate are obtained based on a comparison of the characteristics of theoretical and experimental distributions of the islands size. The proposed method provides useful information on the occurrence of various processes in a microislands system as it approaches the equilibrium state.

Author Biographies

V. I. Psarev, Ukraine

Doctor of Physics and Mathematics, рrofessor

L. A. Parkhomenko, Zaporizhzhya National Technical University

Ph.D., Associate Professor

Y. V. Pyankova, Zaporizhzhya National Technical University

Assistant

References

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Published

2024-11-17

How to Cite

Psarev, V. I., Parkhomenko, L. A., & Pyankova, Y. V. (2024). ON THE IDENTIFICATION TECHNIQUE IN SYSTEM ANALYSIS OF THIN ISLAND FILMS. Radio Electronics, Computer Science, Control, (2), 20. https://doi.org/10.15588/1607-3274-2007-2-5

Issue

Section

Radio electronics and telecommunications