TALANIN, V. I.; TALANIN, I. E.; SEMIKINA, M. U. COMPUTER MODELING OF PRIMARY GROW-IN MICRODEFECTS FORMATION IN DISLOCATION-FREE SILICON MONOCRYSTALS. Radio Electronics, Computer Science, Control, [S. l.], n. 2, 2011. DOI: 10.15588/1607-3274-2010-2-16. Disponível em: https://ric.zp.edu.ua/article/view/14501. Acesso em: 29 nov. 2024.