RYZHOV, Y. V.; SAKOVICH, L. N.; PUCHKOV, O. O.; NEBESNA, Y. E. EVALUATION OF RELIABILITY OF RADIO-ELECTRONIC DEVICES WITH VARIABLE STRUCTURE. Radio Electronics, Computer Science, Control, [S. l.], n. 3, p. 31–41, 2020. DOI: 10.15588/1607-3274-2020-3-3. Disponível em: https://ric.zp.edu.ua/article/view/214684. Acesso em: 27 dec. 2024.